Characterization of a circular thin film plasma source for atomic emission spectroscopy

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Laser Micro-Raman Spectroscopy of CVD Nanocrystalline Diamond Thin Film

Laser micro-Raman spectroscopy is an ideal tool for assessment and characterization of various types of carbon-based materials. Due to its special optical properties (CrN) coated stainless steel substrates. NCD films have been investigated by laser micro-Raman spectroscopy. The fingerprint of diamond based materials is in the spectral region of 1000-1600 cm-1 in the first order of Raman scatter...

متن کامل

Magnetic Thin Film Characterization

An improvement on the fabrication of magnetic thin films is currently on a level of intense research as these films are of great interest in the device industry. Some of these thin films posses high permeability and ferromagnetic resonance (FMR) frequency in the GHz range which are suitable for electromagnetic use. Methods for fabricating these films include sputtering, pulse laser deposition (...

متن کامل

Characterization of nanostructured SnO2 thin film coated by Ag nanoparticles

Nanostructured SnO2 thin films were prepared using Electron Beam-Physical Vapor Deposition (EB-PVD) technique. Then Ag nanoparticles synthesized by laser-pulsed ablation were sprayed on the films. In order to form a homogenous coated of SnO2 on the glass surface, it was thermally treated at 500°C for 1 h. At this stage, the combined layer on the substrate was completely dried for 8 h in the air...

متن کامل

Development Of A High Brilliance X-ray Source For Advanced Thin Film Characterization

X-ray based metrology techniques have demonstrated their capabilities for the measurement of critical process parameters on complex microelectronic thin film structures such as layer crystallinity or texture analysis (X-ray Diffraction, XRD), multilayer thickness (X-ray Reflectivity, XRR), material composition (X-ray Fluorescence, XRF) [1]. Achieving the X-ray beam spatial resolution and photon...

متن کامل

Enhanced photothermal displacement spectroscopy for thin-film characterization using a Fabry-Perot resonator

We have developed a technique for photothermal displacement spectroscopy that is potentially orders of magnitude more sensitive than conventional methods. We use a single Fabry-Perot resonator to enhance both the intensity of the pump beam and the sensitivity of the probe beam. The result is an enhancement of the response of the instrument by a factor proportional to the square of the finesse o...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Spectrochimica Acta Part B: Atomic Spectroscopy

سال: 1985

ISSN: 0584-8547

DOI: 10.1016/0584-8547(85)80151-8